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| IR-FPA Sensors and X-Ray Detectors |
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Infrared sensing applications comprise one of the fastest growing segments of the semi-conductor industry, largely due to the incredible advances made possible by flip chip technology. While compression bonding has quickly become the standard technique for IR/FPA applications (successfully achieved on SET bonders), SET is proud to be pioneering the use of advanced reflow techniques that offer many major advantages.
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Courtesy CEA LETI |
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The SET's Reflow technique offers carefully controlled thermal cycling and joint shaping capability to reduce stress on the joint and assure reliable connections with a high accuracy rate.
For those who desire high force compression bonding, the stable granite base and extreme compression bonding capabilities of SET bonders have no equal in the industry. Meanwhile, SET advances in high-resolution imaging and laser leveling capabilities make high accuracy bonds even more achievable.
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Already heavily used for military and space-based applications, IR sensor packaging technology is fast becoming a desirable option for X-Ray detection in both medical and nuclear applications.
Technology News
SET has developed a substrate chuck and a bond head with a localized confinement chamber which operates safely with reducing gases such as forming gas or formic acid vapor. |
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This patented configuration has been successfully implemented on SET bonder models FC150 and FC300. Especially suited for IR-FPA bonding applications, this machine function enables to remove or prevent oxide formation.
Oxide Removal
Any questions? info@set-sas.fr 
Technical Papers
Download our last technical paper related to IR-FPA bonding: 
Title: Fabrication and performance of InAs/GaSb-based superlattice LWIR detectors*, from HRL Laboratories
*Infrared Technology and Applications XXXVI, edited by Bjørn F. Andresen, Gabor F. Fulop, Paul R. Norton. Proc. of SPIE Vol. 7660, 76601O © 2010 SPIE · CCC code: 0277-786X/10/$18 · doi: 10.1117/12.853410
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